The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2011
Filed:
Nov. 09, 2006
Philip L. Freeman, Maryland Heights, MO (US);
Michael P. Gleason, Edwardsville, IL (US);
Matthew M. Thomas, Florissant, MO (US);
Michael S. Dixon, Saint Louis, MO (US);
Robert B. Pless, Saint Louis, MO (US);
William D. Smart, Clayton, MO (US);
Philip L. Freeman, Maryland Heights, MO (US);
Michael P. Gleason, Edwardsville, IL (US);
Matthew M. Thomas, Florissant, MO (US);
Michael S. Dixon, Saint Louis, MO (US);
Robert B. Pless, Saint Louis, MO (US);
William D. Smart, Clayton, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
A system for evaluating optical distortion in an aircraft transparency, such as a windshield, is disclosed. The system utilizes high resolution digital images (a reference image and a test image) of a test grid structure having a pattern of visible index locations. In one embodiment, the test image is taken through the transparency under test, and the reference image is taken without the transparency. The two images are processed and analyzed by a computing device to determine displacement of each index location, relative to the reference image. The displacement data is further processed to obtain vector divergence field data that represents a quantitative measurement of the optical distortion. The optical distortion measurement data is then rendered in a suitable format that allows the transparency to be rated against certain quality criteria.