The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2011
Filed:
Aug. 06, 2007
Shoupu Chen, Rochester, NY (US);
Daoxian Heidi Zhang, Los Gatos, CA (US);
Yajie Sun, Foster City, CA (US);
Yong Chu, Rochester, NY (US);
Lawrence A. Ray, Rochester, NY (US);
Yang Zheng, San Jose, CA (US);
Yue Shen, Glendale, CA (US);
Shoupu Chen, Rochester, NY (US);
Daoxian Heidi Zhang, Los Gatos, CA (US);
Yajie Sun, Foster City, CA (US);
Yong Chu, Rochester, NY (US);
Lawrence A. Ray, Rochester, NY (US);
Yang Zheng, San Jose, CA (US);
Yue Shen, Glendale, CA (US);
Carestream Health, Inc., Rochester, NY (US);
Abstract
A method for image linear structure detection in medical imaging. The method includes locating microcalcification (mcc) candidate spots in a mammographic image; forming candidate clusters; assigning ranks to the candidate clusters; identifying linear structures in the neighborhood where the candidate clusters reside; and altering the ranks of the candidate clusters for which linear structures have been identified in the neighborhood.