The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2011
Filed:
Jul. 03, 2008
Nicholas George, Pittsford, NY (US);
Xi Chen, San Jose, CA (US);
Nicholas George, Pittsford, NY (US);
Xi Chen, San Jose, CA (US);
Aptina Imaging Corporation, Grand Cayman, KY;
Abstract
For rotationally symmetric aspheric lenses, one can establish lens design and layout based upon the phase delay function exp[−iφ(ρ)]. An embodiment of the invention is a method for calculating a corresponding variation in focal length denoted by f(ρ). According to an aspect, one can also assert a shape for the focal length f(ρ) and thereafter calculate a phase delay function in order to synthesize a novel lens. New EDoF lens designs are obtained by selection of an inner and outer focal length connected by a simple curve that can be approximate by a polynomial. From the selected f(ρ), one can synthesize a finished EDoF lens design and fabricate the lens. Another aspect of this invention is directed to a method to tailor prior-art EDoF lenses so that their performance over some range is improved.