The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2011
Filed:
Oct. 24, 2005
Oingyang HU, Clifton Park, NY (US);
Donald Wagner Hamilton, Burnt Hills, NY (US);
Kevin George Harding, Nishkayuna, NY (US);
Joseph Benjamin Ross, Cincinnati, OH (US);
Oingyang Hu, Clifton Park, NY (US);
Donald Wagner Hamilton, Burnt Hills, NY (US);
Kevin George Harding, Nishkayuna, NY (US);
Joseph Benjamin Ross, Cincinnati, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for inspecting an object includes emitting light from at least one of a liquid crystal display (LCD) device and a liquid crystal on silicon (LCOS) device, phase-shifting light emitted from at least one of the LCD device and the LCOS device, projecting the phase-shifted light onto a surface of an object, receiving light reflected from the object surface with an imaging sensor, and analyzing the light received by the imaging sensor to facilitate inspecting at least a portion of the object.