The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

Jun. 04, 2007
Applicants:

Shunsuke Sasaki, Tokyo, JP;

Tsuyoshi Inuma, Nagano, JP;

Yoshio Yamada, Nagano, JP;

Mitsuhiro Nagaya, Nagano, JP;

Takashi Akao, Nagano, JP;

Hiroshi Nakayama, Nagano, JP;

Inventors:

Shunsuke Sasaki, Tokyo, JP;

Tsuyoshi Inuma, Nagano, JP;

Yoshio Yamada, Nagano, JP;

Mitsuhiro Nagaya, Nagano, JP;

Takashi Akao, Nagano, JP;

Hiroshi Nakayama, Nagano, JP;

Assignee:

NHK Spring Co., Ltd., Yokohama-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe card includes a flat wiring board having a wiring pattern corresponding to a circuit structure for generating a signal for a test, an interposer that is stacked on the wiring board and relays wirings of the wiring board, a space transformer that is stacked on the interposer and fastened thereto by an adhesive, transforms a space between the wirings relayed by the interposer, and leads the wirings out to a surface opposite a surface facing the interposer, and a probe head that is stacked on the space transformer and houses and holds a plurality of probes.


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