The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

Feb. 27, 2009
Applicants:

Yong Ming Dai, Shanghai, CN;

Qiang Zhang, Shenzhen, CN;

Weigang Wu, Shenzhen, CN;

Inventors:

Yong Ming Dai, Shanghai, CN;

Qiang Zhang, Shenzhen, CN;

Weigang Wu, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method and apparatus for removing artifacts during magnetic resonance imaging, a number of sets of 3D are generated data by scanning, with each set of 3D data containing a number of sets of 2D data. A weighted sum of all the 2D data corresponding to the same overlapped slab is formed. Maximum intensity projection of all the 2D data is implemented, followed by the superposition of the weighted sum data and the maximum intensity projection data to generate the 2D data corresponding to the overlapped slab. The maximum intensity projection of the 3D data formed by 2D data of non-overlapped slabs and 2D data of the corresponding overlapped slabs is implemented so as to generate a final image.


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