The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

Jan. 31, 2008
Applicants:

Akio Sugi, Matsumoto, JP;

Tatsuji Nagaoka, Matsumoto, JP;

Hong-fei LU, Matsumoto, JP;

Inventors:

Akio Sugi, Matsumoto, JP;

Tatsuji Nagaoka, Matsumoto, JP;

Hong-fei Lu, Matsumoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/76 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a MIS-type semiconductor device having a trench gate structure, a withstand voltage is ensured without changing the thickness of a drift layer and on-resistance can be reduced without applying a high gate drive voltage. The lower half of a trench extending through a p-base region into an n-drift region is filled with a high-permittivity dielectric having a relative permittivity that is higher than that of a silicon oxide film, preferably a silicon nitride film, and an insulated gate structure including a gate insulator and a gate electrode is fabricated on the high-permittivity dielectric. The depth dof the deepest portion of the high-permittivity dielectric is designed to be deeper than the depth dof a depletion layer in the semiconductor region away from the high-permittivity dielectric.


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