The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2011
Filed:
Nov. 17, 2008
Jacques Goldberg, Haifa, IL;
Isaac Shpantzer, Bethesda, MD (US);
Yaakov Achiam, Rockville, MD (US);
Nadejda Reingand, Baltimore, MD (US);
Jacques Goldberg, Haifa, IL;
Isaac Shpantzer, Bethesda, MD (US);
Yaakov Achiam, Rockville, MD (US);
Nadejda Reingand, Baltimore, MD (US);
CeLight, Inc., Silver Spring, MD (US);
Abstract
A method and system for high Z material revealing using muon detection technique is presented. The system measures muons' coordinates, velocities, incidence angles and leaving angles. Two series of detectors: one above and one below the interrogated volume are used. A muon trajectory deviation from an expected trajectory is used for the decision making on the presence of high Z material inside the volume. The muon velocity is measured using either a ring Cerenkov counter, a transition radiation detector or/and a threshold Cerenkov counter. The expected trajectory is calculated basing on known particle velocity.