The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2011
Filed:
Dec. 30, 2005
Seok Jin Yoon, Daejeon, KR;
Gyu Sang Shin, Daejeon, KR;
Seok Jin Yoon, Daejeon, KR;
Gyu Sang Shin, Daejeon, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Abstract
Provided are an apparatus and method for generating a test driver, capable of reducing errors caused in component development early on by enabling immediate checking as to whether architecture design requirements are satisfied during component development. Specific snapshot information is input to the interface for the individual component of the architecture model to extract a state variable storing the state information of the component. An interface that sets and checks the state variable is then added to enable unit testing for the component to proceed smoothly. Using an interface giving access to the state variable, a test preparation code setting a test environment and a test check code checking whether the state variable after interfacing reaches a proper state are generated, thereby automatically generating a test driver code.