The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2011

Filed:

Sep. 29, 2006
Applicants:

Shawn J. Bohn, Richland, WA (US);

Manoj Kumar Krishnan, Richland, WA (US);

Wendy E. Cowley, Richland, WA (US);

Jarek Nieplocha, Richland, WA (US);

Inventors:

Shawn J. Bohn, Richland, WA (US);

Manoj Kumar Krishnan, Richland, WA (US);

Wendy E. Cowley, Richland, WA (US);

Jarek Nieplocha, Richland, WA (US);

Assignee:

Battelle Memorial Institute, Richland, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatuses and computer-implemented methods for analyzing, on shared and distributed computing systems, information comprising one or more documents are disclosed according to some aspects. In one embodiment, information analysis can comprise distributing one or more distinct sets of documents among each of a plurality of processes, wherein each process performs operations on a distinct set of documents substantially in parallel with other processes. Operations by each process can further comprise computing term statistics for terms contained in each distinct set of documents, thereby generating a local set of term statistics for each distinct set of documents. Still further, operations by each process can comprise contributing the local sets of term statistics to a global set of term statistics, and participating in generating a major term set from an assigned portion of a global vocabulary.


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