The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2011
Filed:
Nov. 19, 2008
Applicants:
Pu Huang, Yorktown Heights, NY (US);
Hui Lei, Scarsdale, NY (US);
Lipyeow Lim, White Plains, NY (US);
Inventors:
Pu Huang, Yorktown Heights, NY (US);
Hui Lei, Scarsdale, NY (US);
Lipyeow Lim, White Plains, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
A metric network provides a descriptive model that explicitly expresses the relationships among all metrics of a business enterprise. Performance of each single business entity in the operational level is measured by a set of primitive metrics, each of which measures a specific aspect of the business entity. The primitive metrics construct the base on which the whole metric network is built.