The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2011

Filed:

May. 14, 2003
Applicants:

Jonathan S. Lewin, Beachwood, OH (US);

Jeffrey L. Duerk, Avon Lake, OH (US);

Daniel Elgort, Cleveland Heights, OH (US);

Inventors:

Jonathan S. Lewin, Beachwood, OH (US);

Jeffrey L. Duerk, Avon Lake, OH (US);

Daniel Elgort, Cleveland Heights, OH (US);

Assignee:

Case Western Reserve University, Cleveland, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for automatically adapting image acquisition parameters based on imaging and/or device tracking feedback is provided. An example system includes a subsystem for acquiring images (e.g., MR) of an object and tracking data for a device (e.g. catheter) inserted into the object and controllably moveable within the object. The system also includes an image processor for processing the images and a device tracking logic for computing device parameters (e.g., speed, direction of travel, rate of speed change, position, position relative to a landmark, device orientation). Based on the images and device parameter computations, a parameter control and adjustment logic can automatically update one or more image acquisition parameters that control the image acquisition subsystem.


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