The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2011
Filed:
Dec. 18, 2003
Akio Kosaka, Hachioji, JP;
Kazuhiko Arai, Hachioji, JP;
Takashi Miyoshi, Atsugi, JP;
Kazuhiko Takahashi, Hachioji, JP;
Hidekazu Iwaki, Hachioji, JP;
Akio Kosaka, Hachioji, JP;
Kazuhiko Arai, Hachioji, JP;
Takashi Miyoshi, Atsugi, JP;
Kazuhiko Takahashi, Hachioji, JP;
Hidekazu Iwaki, Hachioji, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A calibration apparatus which estimates a calibration parameter of an image acquisition apparatus, comprises a calibration jig which includes at least two planes and in which calibration markers having known three-dimensional positions are arranged in each plane based on a predetermined rule. The calibration apparatus further comprises a calibration marker recognition section configured to measure and number in-image positions of the calibration markers in at least one image obtained by photographing the calibration jig by the image acquisition apparatus, and a parameter estimate section configured to estimate the calibration parameters of the image acquisition apparatus by the use of the three-dimensional position and the in-image position of the calibration markers numbered by the calibration marker recognition section.