The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2011
Filed:
May. 25, 2006
Masaki Kato, Kanagawa, JP;
Katsuyuki Yamada, Kanagawa, JP;
Kazunori Ito, Kanagawa, JP;
Michiaki Shinotsuka, Kanagawa, JP;
Eiko Hibino, Kanagawa, JP;
Masaru Shinkai, Kanagawa, JP;
Hiroyoshi Sekiguchi, Kanagawa, JP;
Masaki Kato, Kanagawa, JP;
Katsuyuki Yamada, Kanagawa, JP;
Kazunori Ito, Kanagawa, JP;
Michiaki Shinotsuka, Kanagawa, JP;
Eiko Hibino, Kanagawa, JP;
Masaru Shinkai, Kanagawa, JP;
Hiroyoshi Sekiguchi, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A method of recording information using a laser on a multilayer optical disk having a plurality of recording layers is provided. The plurality of recording layers include a first recording layer and a second recording layer adjacent the first recording layer. The first recording layer is provided with a first test writing area to be used for calibration of write power, and the second recording layer is provided with a second test writing area to be used for calibration of write power. The disk is arranged so that a first region of the first test writing area is superposed with a second region of the second test writing area when considered in the direction in which the laser is arranged to irradiate. The method comprises, if the second region of the second test writing area is unrecorded, recording data in the second region of the second test writing area, thereby converting the second region of the second test writing area into a recorded state; and once the second region of the second test writing area has been converted into a recorded state, performing test writing in the first region of the first test writing area.