The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2011
Filed:
Jun. 27, 2007
Mark A. Meier, Houston, TX (US);
Mark A. Meier, Houston, TX (US);
ExxonMobil Upstream Research Co., Houston, TX (US);
Abstract
Method for designing a converted mode (PS or SP) seismic survey to accomplish specified vertical and lateral resolution objectives at target depth. An equation () is provided for determining the minimum bandwidth required for a desired vertical resolution at a selected scattering angle, as a function of incident and reflected wave velocities, one of which is the P-wave velocity and the other is the S-wave velocity. A second equation () is provided for determining migration acceptance angle from the desired vertical and lateral resolutions. Source and receiver apertures may then be determined by ray tracing. Finally, a third equation () is provided for the maximum bin size to avoid aliasing, given the migration acceptance angle and a maximum frequency needed to achieve the bandwidth requirement. Source and receiver spacing may then be based on the maximum bin size.