The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7894053 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 22, 2011

Filed:

Sep. 24, 2008
Applicants:

Masanori Fukuda, Osaka, JP;

Yutaka Omori, Osaka, JP;

Koichi Wakitani, Osaka, JP;

Inventors:

Masanori Fukuda, Osaka, JP;

Yutaka Omori, Osaka, JP;

Koichi Wakitani, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An inspection apparatus includes a stage allowing an inspection subject to be mounted thereonto, an illumination unit for emitting diffused light to the inspection subject, an imaging unit disposed to face the illumination unit with the inspection subject interposed therebetween, for taking the diffused light that is emitted from the illumination unit and is transmitted through the inspection subject, a first prism sheet disposed between the inspection subject and the illumination unit and having a first prism surface with a plurality of prisms aligned in a stripe pattern to face the illumination unit, a second prism sheet disposed between the illumination unit and the first prism sheet and having a second prism surface with a plurality of prisms aligned in a stripe pattern to face the first prism surface.


Find Patent Forward Citations

Fukuda, Masanori. (2011). Inspection apparatus (U.S. Patent No. 7894053). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7894053

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