The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2011

Filed:

Jul. 28, 2005
Applicants:

Pavel Nikitin, Seattle, WA (US);

Venkata Kodukula, Bothell, WA (US);

For Sander Lam, Bothell, WA (US);

Andrew Reynolds, Bothell, WA (US);

Rene Martinez, Seattle, WA (US);

Inventors:

Pavel Nikitin, Seattle, WA (US);

Venkata Kodukula, Bothell, WA (US);

For Sander Lam, Bothell, WA (US);

Andrew Reynolds, Bothell, WA (US);

Rene Martinez, Seattle, WA (US);

Assignee:

Intermec IP Corp., Everett, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q 5/22 (2006.01); G08B 13/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A radio frequency identification system comprises a radio-frequency identification substrate and an interrogator. In one embodiment, the radio-frequency identification substrate comprises a plurality of radio-frequency identification devices. In one embodiment, a controller on the substrate controls a first one of the plurality of radio-frequency identification devices based on a state of a second one of the plurality of radio-frequency identification devices. In one embodiment, an antenna system includes an S-shaped portion electrically coupled to an integrated circuit along a central portion of the S-shaped portion. Adjusting the parameters of the segments making up the S-shaped portion controls performance characteristics of a radio-frequency identification device.


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