The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2011

Filed:

Jul. 07, 2009
Applicants:

Masaru Inoue, Tokyo, JP;

Kunihiko Sasaki, Tokyo, JP;

Takashi Kurihara, Yokohama, JP;

Yasuhiro Kume, Kawachinagano, JP;

Inventors:

Masaru Inoue, Tokyo, JP;

Kunihiko Sasaki, Tokyo, JP;

Takashi Kurihara, Yokohama, JP;

Yasuhiro Kume, Kawachinagano, JP;

Assignees:

Toyo Corporation, Tokyo, JP;

Sharp Kabushiki Kaisha, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.


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