The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2011

Filed:

Dec. 19, 2008
Applicants:

Kazunobu Irie, Tokyo, JP;

Tetsuo Oosono, Tokyo, JP;

Inventors:

Kazunobu Irie, Tokyo, JP;

Tetsuo Oosono, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 51/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

One embodiment of the present invention is an organic electroluminescence element defect inspection apparatus wherein the apparatus brings in an optical image of a substrate to be inspected and detects a pattern defect of an organic luminescent layer on the substrate to be inspected. The above is performed after an organic luminescent layer is formed on a substrate in a method of manufacturing an organic electroluminescence element. The organic electroluminescence element includes at least one or more organic luminescent layers having a luminescence area, an anode which injects a hole into the organic luminescent layer and a cathode which injects an electrode into the organic luminescent layer on a substrate. And an optical source for obtaining an optical image from a substrate to be inspected is infra-red radiation.


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