The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7893400 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 22, 2011

Filed:

Apr. 30, 2008
Applicant:

Hisashi Togashi, Tsukuba, JP;

Inventor:

Hisashi Togashi, Tsukuba, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/10 (2006.01); H01J 49/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is disclosed a method of performing laser desorption/ionization mass spectrometry based on ions generated by exposing a sample supported on a substrate to laser light, the sample being to be subjected to spectrum analysis. The method includes the steps of (a) causing a part of the ions to be generated through one of an interaction between the laser light and a surface of the substrate and an interaction between the laser light and an interface between the substrate and the sample; and (b) determining the generated part of the ions to be index ions and identifying a signal to become noise in the laser desorption/ionization mass spectrometry using a signal of the index ions, thereby performing the spectrum analysis without an effect of the noise.


Find Patent Forward Citations

Togashi, Hisashi. (2011). Method for laser desorption/ionization mass spectrometry, sample supporting substrate used therein, and substrate material testing method (U.S. Patent No. 7893400). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7893400

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