The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2011
Filed:
Aug. 16, 2006
Yukiko Kodama, Osaka, JP;
Kazushige Hatanaka, Kyoto, JP;
Koichi Tanaka, Osaka, JP;
Hiroko Nakagawa, Chiba, JP;
Shogo Moriya, Chiba, JP;
Kaoru Osano, Chiba, JP;
Yukiko Kodama, Osaka, JP;
Kazushige Hatanaka, Kyoto, JP;
Koichi Tanaka, Osaka, JP;
Hiroko Nakagawa, Chiba, JP;
Shogo Moriya, Chiba, JP;
Kaoru Osano, Chiba, JP;
Suntory Holdings Limited, Osaka-shi, Osaka, JP;
Abstract
The present invention relates to an instrument, a method and a kit for detecting a microorganism contaminating a subject test sample, which enables one to quickly and accurately identify the microorganism with an easy operation. The instrument for detecting a microorganism according to the present invention relates to a microarray type instrument in which oligonucleotides prepared based on nucleotide sequences specific to the species and genus to which the subject microorganism belongs have been immobilized onto a surface of a substrate. Based on the presence or absence of hybridization of the probes prepared from the test sample with the oligonucleotides immobilized onto the surface of the substrate, the present invention makes it possible to detect and/or identify the microorganism in the test sample easily, quickly and accurately.