The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2011
Filed:
Feb. 15, 2007
Masahiro Sakaguchi, Ibaraki, JP;
Mitsuru Yamaguchi, Ibaraki, JP;
Tomio Takahashi, Ibaraki, JP;
Kouichi Takemoto, Ibaraki, JP;
Masahiro Sakaguchi, Ibaraki, JP;
Mitsuru Yamaguchi, Ibaraki, JP;
Tomio Takahashi, Ibaraki, JP;
Kouichi Takemoto, Ibaraki, JP;
JX Nippon Mining & Metals Corporation, Tokyo, JP;
Abstract
A nickel crucible used for melting an analytical sample in the pretreatment of the analytical sample, characterized in that the purity of the nickel crucible is 99.9999 wt % or higher. Also provided is a method of analysis, comprising melting a sample by the use of the nickel crucible for melting having a purity of 99.9999 wt % or higher, and analyzing the melt to thereby obtain an analytical result in which the respective lower limits of determination of Mn, Al, Si, Mg, Pb, Fe, Co, Ti, Cu, Cr, Zr, Mo, and W are Mn: 5 wtppm, Al: 10 wtppm, Si: 10 wtppm, Mg: 5 wtppm, Pb: 5 wtppm, Fe: 5 wtppm, Co: 5 wtppm, Ti: 20 wtppm, Cu: 20 wtppm, Cr: 10 wtppm, Zr: 5 wtppm, Mo: 2 wtppm, and W: 10 wtppm. In light of the recent analytical technology demanded of fast and accurate measurement of high purity materials, high purity analysis is attained through inhibition of mixing of impurities from the crucible.