The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2011
Filed:
Sep. 30, 2008
Peter J. Fellingham, San Diego, CA (US);
David A. Neese, Escondido, CA (US);
Peter J. Fellingham, San Diego, CA (US);
David A. Neese, Escondido, CA (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method of measuring a relative offset between a first array of marking elements and a second array of marking elements in a printer; a registration target; and a printer are provided. The method includes printing a target by printing a first group of pixels using a plurality of marking elements from the first array and printing a second group of pixels using a plurality of marking elements from the second array; scanning the target to measure an optical characteristic of the target as a function of position along the target; and identifying a position at which an extreme in the optical characteristic of the target occurs.