The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2011

Filed:

Jun. 29, 2005
Applicants:

Anders B. Vinberg, Kirkland, WA (US);

Robert M. Fries, Redmond, WA (US);

Kevin Grealish, Seattle, WA (US);

Galen C. Hunt, Bellevue, WA (US);

Aamer Hydrie, Seattle, WA (US);

Edwin R. Lassettre, Redmond, WA (US);

Rob Mensching, Redmond, WA (US);

Geoffrey Outhred, Seattle, WA (US);

John M. Parchem, Seattle, WA (US);

Przemek Pardyak, Seattle, WA (US);

Bassam Tabbara, Seattle, WA (US);

Rene Antonio Vega, Kirkland, WA (US);

Robert V. Welland, Seattle, WA (US);

Eric J. Winner, Woodinville, WA (US);

Jeffrey A. Woolsey, Redmond, WA (US);

Inventors:

Anders B. Vinberg, Kirkland, WA (US);

Robert M. Fries, Redmond, WA (US);

Kevin Grealish, Seattle, WA (US);

Galen C. Hunt, Bellevue, WA (US);

Aamer Hydrie, Seattle, WA (US);

Edwin R. Lassettre, Redmond, WA (US);

Rob Mensching, Redmond, WA (US);

Geoffrey Outhred, Seattle, WA (US);

John M. Parchem, Seattle, WA (US);

Przemek Pardyak, Seattle, WA (US);

Bassam Tabbara, Seattle, WA (US);

Rene Antonio Vega, Kirkland, WA (US);

Robert V. Welland, Seattle, WA (US);

Eric J. Winner, Woodinville, WA (US);

Jeffrey A. Woolsey, Redmond, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/445 (2006.01); G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Model-based provisioning of test environments includes accessing a model of an application to be installed in a test environment of a system and further accessing a model of the system and a model of the test environment. An installation specification for the application is also generated, the installation specification being derived at least in part from the model of the application, the model of the system, and the model of the test environment.


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