The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
Sep. 28, 2005
Applicants:
Hideya Ikeda, Bunkyo, JP;
Kentaro Nishimura, Bunkyo, JP;
Minoru Yamamoto, Bunkyo, JP;
Inventors:
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test recording method capable of preventing omission of tests for software to be delivered. When test input data is entered from a testing client, a data transmitter transmits the data to a testing server. Upon reception of test output data and a hash value from the testing server, an evaluation unit determines a test result, pass or fail, by comparing the test output data with the output pattern described in a test specification. The result recorder stores a test log in a log memory, the test log including the test result and the hash value received from the testing server.