The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
Jun. 27, 2007
Dongmei Zhang, Redmond, WA (US);
Yingnong Dang, Beijing, CN;
Xiaohui Hou, Beijing, CN;
Song Huang, Beijing, CN;
Jian Wang, Beijing, CN;
Dongmei Zhang, Redmond, WA (US);
Yingnong Dang, Beijing, CN;
Xiaohui Hou, Beijing, CN;
Song Huang, Beijing, CN;
Jian Wang, Beijing, CN;
Microsoft Corporation, Redmond, WA (US);
Abstract
Described herein is technology for, among other things, accessing error report information. It involves various techniques and tools for analyzing and interrelating failure data contained in error reports and thereby facilitating developers to more easily and quickly solve programming bugs. Numerous parameters may also be specified for selecting and searching error reports. Several reliability metrics are provided to better track software reliability situations. The reliability metrics facilitate the tracking of the overall situation of failures that happen in the real word by providing metrics based on error reports (e.g., failure occurrence trends, failure distributions across different languages).