The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
Jun. 13, 2007
Chad E. Verbowski, Redmond, WA (US);
Jiahe Helen Wang, Issaquah, WA (US);
John C. Platt, Redmond, WA (US);
Ruyun Zhang, Beijing, CN;
Yu Chen, Beijing, CN;
Chad E. Verbowski, Redmond, WA (US);
Jiahe Helen Wang, Issaquah, WA (US);
John C. Platt, Redmond, WA (US);
Ruyun Zhang, Beijing, CN;
Yu Chen, Beijing, CN;
Microsoft Corporation, Redmond, WA (US);
Abstract
A method and system for identifying a configuration parameter of a 'sick' computer system that is at fault for causing an undesired behavior based on analysis of configuration parameters from other computer systems is provided. In one embodiment, a troubleshooting system collects 'suspect' values for “suspect” configuration parameters used by a “sick” application when the undesired behavior was exhibited by the sick computer system. The troubleshooting system then compares the suspect values to sample values of the suspect configuration parameters retrieved from sample computer systems. The troubleshooting system uses that comparison to identify one or more suspect configuration parameters that are likely at fault for causing the application to exhibit the undesired behavior.