The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
Dec. 03, 2008
Loc T. Le, San Jose, CA (US);
Loc T. Le, San Jose, CA (US);
Ricoh Company, Ltd, Tokyo, JP;
Abstract
A standard input for a regression test is processed in a printing system in a first (standard) configuration to generate a standard output. The standard output may include a standard PDL output and a standard bitmap. The standard input is processed in the printing system in a second configuration to be tested to generate regression test output. The regression test output may include a test PDL output and test bitmap. The regression test output and the standard output are compared to determine if changes included in the second configuration of the printing system produce an undesirable effect. Each standard input and corresponding standard output is identified by a unique test identifier and is stored.