The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2011

Filed:

Nov. 02, 2007
Applicants:

Tomio Miyano, Kanagawa, JP;

Hideaki Hori, Kanagawa, JP;

Inventors:

Tomio Miyano, Kanagawa, JP;

Hideaki Hori, Kanagawa, JP;

Assignee:

Ono Sokki Co., Ltd., Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The object of the invention is providing a revolution indicator and a program for the indicator, which can detect a varying number of revolutions precisely. The indicator includes: a detecting portion detecting a physical phenomenon resulting from the revolution movement of a measuring object; a FFT computation portion performing a fast Fourier transform of the data detected by the detecting portion under a specific data length, and computing and outputting the analytical data; and a revolution computing portion computing the number of revolutions of the measuring object based on the analytical data output from the FFT computation portion. A variation determination portion is equipped, which makes the FFT computation portion compute the first analytical data continuously, based on the data successively detected by the detecting portion under the first data length and determines whether there is any variation or not in the first analytical data computed continuously.


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