The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
Apr. 18, 2006
Applicant:
James D. Christian, Austin, TX (US);
Inventor:
James D. Christian, Austin, TX (US);
Assignee:
Picture Code, Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
Embodiments of the present invention provide a method and system for characterizing noise in a set of data based on an analysis of subsets of the data. For example, noise for an image can be characterized based on analyzing selected regions of the image. The characterization of the noise can be stored in a data structure that models the noise as jointly dependent on values of multiple parameters (pixel values for multiple channels). The noise can be further characterized for one or more wavelet subbands of the set of data.