The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2011

Filed:

Jun. 25, 2007
Applicants:

Hui Zhang, Sunnyvale, CA (US);

Bai Wang, Palo Alto, CA (US);

Dongshan Fu, Santa Clara, CA (US);

Inventors:

Hui Zhang, Sunnyvale, CA (US);

Bai Wang, Palo Alto, CA (US);

Dongshan Fu, Santa Clara, CA (US);

Assignee:

Accuray Incorporated, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique for generating DRR (digitally reconstructed radiography) images includes dividing sample points along a ray trajectory through a 3-dimensional dataset of attenuation values into stages. Each of the stages includes a plurality of the sample points. The attenuation values are summed along the ray trajectory for each of the sample points. Intermediate summation values are computed for each of the stages along the ray trajectory and for each of the stages the attenuation values summed within a given stage are summed with a previous stage intermediate summation value calculated for a stage previous to the given stage to generate a given stage intermediate summation value. A final accumulation value being representative of a total attenuation summed along the ray trajectory is calculated.


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