The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
Nov. 23, 2005
Robert a Cordery, Danbury, CT (US);
Matthew J Campagna, Ridgefield, CT (US);
Thomas J Foth, Trumbull, CT (US);
Bertrand Haas, New Haven, CT (US);
Douglas B Quine, Bethel, CT (US);
Robert A Cordery, Danbury, CT (US);
Matthew J Campagna, Ridgefield, CT (US);
Thomas J Foth, Trumbull, CT (US);
Bertrand Haas, New Haven, CT (US);
Douglas B Quine, Bethel, CT (US);
Pitney Bowes Inc., Stamford, CT (US);
Abstract
A method for detecting whether perforations are present on the edge of an image of a form, such as a check, includes obtaining a bitmap of the image, identifying a selected portion of the bitmap that corresponds to at least the edge and that includes a matrix of a plurality of rows and columns of brightness values, and selecting a particular one of the rows of brightness values. The method further includes performing a Fourier transform of the brightness values included in the particular selected row to generate a Fourier transform output, and determining whether a series of perforations is present based on the Fourier transform output. The method may also include steps wherein the brightness values are low pass filtered and wherein the values in the selected row are high pass filtered prior to the step of performing a Fourier transform.