The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
May. 30, 2006
Applicants:
Christian David, Lauchringen, DE;
Franz Pfeiffer, Brugg, CH;
Timm Weitkamp, Ueberlingen, DE;
Inventors:
Assignee:
Paul Scherrer Institut, illigen PSI, CH;
Primary Examiner:
Int. Cl.
CPC ...
G03H 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An interferometer for X-rays, in particular hard X-rays, for obtaining quantitative phase contrast images, includes a standard polychromatic X-ray source, a diffractive optical beam splitter other than a Bragg crystal in transmission geometry, and a position-sensitive detector with spatially modulated detection sensitivity.