The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2011

Filed:

Dec. 18, 2003
Applicants:

Robert August Kaucic, Niskayuna, NY (US);

Ricardo Scott Avila, Clifton Park, NY (US);

Samit Kumar Basu, Niskayuna, NY (US);

Forrest Frank Hopkins, Scotia, NY (US);

Inventors:

Robert August Kaucic, Niskayuna, NY (US);

Ricardo Scott Avila, Clifton Park, NY (US);

Samit Kumar Basu, Niskayuna, NY (US);

Forrest Frank Hopkins, Scotia, NY (US);

Assignee:

Morpho Detection, Inc., Newark, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for ascertaining the identity of an object within an enclosed article. The system includes an acquisition subsystem, a reconstruction subsystem, a computer-aided detection (CAD) subsystem, and an alarm resolution subsystem. The acquisition subsystem communicates view data to the reconstruction subsystem, which reconstructs it into image data and communicates it to the CAD subsystem. The CAD subsystem analyzes the image data to ascertain whether it contains any area of interest. A feedback loop between the reconstruction and CAD subsystems allows for continued, more extensive analysis of the object. Other information, such as risk variables or trace chemical detection information may be communicated to the CAD subsystem to dynamically adjust the computational load of the analysis.


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