The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
Apr. 26, 2007
Kenji Itoh, Hirakata, JP;
Kenji Itoh, Hirakata, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
Included are an illumination lamp () for illuminating a color filter edge () at a predetermined angle of incidence, a sensor () for taking at least two images by imaging light reflected at a predetermined angle different from the angle of incidence, an image processing section () for calculating a difference in luminance within a color filter in accordance with the images thus taken, and a defect determination section () for determining the existence of unevenness in the color filter from the difference in luminance. Provided thereby are a color filter inspection method and a color filter inspection apparatus, each for early discovering unevenness through macroscopic observation of the whole color filter by illuminating the color filter edge and by taking reflected light that is not specular reflected light, the unevenness occurring in a drying step, the color filter edge containing a boundary between a pixel and a black matrix. Further provided is a method for manufacturing a color filter with use of the color filter inspection method.