The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
Nov. 16, 2006
Trent Ridder, Woodbridge, VA (US);
Ben Ver Steeg, Redlands, CA (US);
Michael Haass, Albuquerque, NM (US);
John D. Maynard, Albuquerque, NM (US);
Zachary Benz, Albuquerque, NM (US);
Trent Ridder, Woodbridge, VA (US);
Ben ver Steeg, Redlands, CA (US);
Michael Haass, Albuquerque, NM (US);
John D. Maynard, Albuquerque, NM (US);
Zachary Benz, Albuquerque, NM (US);
TruTouch Technologies, Inc., Albuquerque, NM (US);
Abstract
The present invention provides improved methods and apparatuses for accurate measurements using interferometers. A functional relationship between the optical path difference and time is determined from a reference signal from an interferometer. The times at which the interferometer had specific optical path differences can be determined from the functional relationship. Those times can then be used to select times at which the spectroscopic signal from the interferometer was produced at the specific optical path differences. The invention can be applied, as examples, to maintain instrument calibration, and to transfer or compare calibrations or measurements across different interferometers.