The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2011

Filed:

May. 21, 2008
Applicants:

Garry Chinn, San Mateo, CA (US);

Craig S. Levin, Palo Alto, CA (US);

Inventors:

Garry Chinn, San Mateo, CA (US);

Craig S. Levin, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems for determining a location of a photon event for an imaging system including a plurality of 3-D detectors. For one of the photons in the photon pair, an interaction in a first 3-D detector is detected. For the other of the photons in the photon pair, at least two interactions in a second 3-D detector are detected. A cone-surface projector function is produced based on the at least two interaction locations in the second 3-D detector. A projector function is produced based on the produced cone-surface projector function, the detected interaction in the first 3-D detector, and the at least two detected interactions in the second 3-D detector.


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