The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2011

Filed:

Jan. 22, 2009
Applicants:

Ralf Wolleschensky, Apolda, DE;

Joerg Steinert, Jena, DE;

Michael Goelles, Jena, DE;

Kristina Uhlendorf, Jena, DE;

Inventors:

Ralf Wolleschensky, Apolda, DE;

Joerg Steinert, Jena, DE;

Michael Goelles, Jena, DE;

Kristina Uhlendorf, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/14 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

For a confocal scanning microscope () an optical zoom system () with linear scanning is provided, which not only makes a zoom function possible, in that a variable magnification of an image is possible, but rather which additionally produces a pupil image in the illuminating beam path (IB) [BS] and thereby makes a variable image length possible (distance between the original pupil (En.P) [EP] and the imaged/reproduced pupil (Ex.P) [AP]) so that axially varying objective pupil positions can thereby be compensated.


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