The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
May. 05, 2008
Roland Barth, Jena, DE;
Roland Bergner, Jena, DE;
Klaus-ditmar Voigt, Jena, DE;
Frank Behrendt, Jena, DE;
Burkhard Dietzel, Buergel, DE;
Eberhard Hofmann, Bollberg, DE;
Gert Stober, Jena, DE;
Peter Klopfleisch, Jena, DE;
Roland Barth, Jena, DE;
Roland Bergner, Jena, DE;
Klaus-Ditmar Voigt, Jena, DE;
Frank Behrendt, Jena, DE;
Burkhard Dietzel, Buergel, DE;
Eberhard Hofmann, Bollberg, DE;
Gert Stober, Jena, DE;
Peter Klopfleisch, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
The invention is directed to an arrangement and a method for measuring the anterior segment of the eye using interferometric means. The eye is illuminated by a convergent beam bundle and aligned with the optical axis of the measuring device by generating directional stimuli and accommodation stimuli by means of a display which is mirrored into the beam path.