The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
May. 19, 2005
Hak-joo Lee, Daejeon, KR;
Shin Hur, Daejeon, KR;
Jae-hyun Kim, Daejeon, KR;
Seung-woo Han, Daejeon, KR;
Jung-yup Kim, Daejeon, KR;
Ki-ho Cho, Daejeon, KR;
Hak-joo Lee, Daejeon, KR;
Shin Hur, Daejeon, KR;
Jae-hyun Kim, Daejeon, KR;
Seung-woo Han, Daejeon, KR;
Jung-yup Kim, Daejeon, KR;
Ki-ho Cho, Daejeon, KR;
Abstract
Disclosed herein is an apparatus for measuring adhesive and frictional properties of a polymer hemisphere relative to a contact plate provided in the apparatus. The apparatus comprise a body having a movable table installed to move along an X-axis and Y-axis and a vertical column positioned at a rear side of the movable table, a sample mount provided on the movable table and having a mirror to reflect surface images of a horizontal contact plate, a head assembly located at a front side of the column and having a polymer hemisphere used to press a surface of the contact plate to implement an adhesive force test, a camera device located at a front side of the mirror to capture the surface images of the contact plate during the adhesive force test, and a control device for analyzing various data inputted thereto during the adhesive force test.