The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2011

Filed:

Dec. 27, 2005
Applicants:

Hideki Tai, Yokohama, JP;

Mari Abe, Yokohama, JP;

Inventors:

Hideki Tai, Yokohama, JP;

Mari Abe, Yokohama, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, program, and information processing apparatus for detecting an inconsistency in an application program before the application program is implemented. The described is detecting a consistency or inconsistency in the design of screen transition of an application program, by generating a control flow graph for the application program, calculating from the control flow graph the solution of dataflow problem which occurs in the application program, detecting an inconsistency in the application program on the basis of the calculated solution, and displaying information concerning a detected inconsistency.


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Tai, Hideki. (2011). Application program development assisting method, program, and information processing apparatus (U.S. Patent No. 7886276). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7886276

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