The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2011

Filed:

Feb. 21, 2007
Applicants:

Mirko Boettcher, Ipswich, GB;

Frank Hoeppner, Braunschweig, DE;

Inventors:

Mirko Boettcher, Ipswich, GB;

Frank Hoeppner, Braunschweig, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G06F 17/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a method of detecting the growth and development of clusters in a data set. The data set is divided into a number of slices and an algorithm is applied to the data held in each data slice set. Each slice can be compared with the subsequent slice to determine which clusters persist from slice to slice. Random data agglomerations in a single slice may give the appearance of a cluster but their random nature means that they are unlikely to persist so those clusters that persist across a number of slices, or that show the strongest measure of persistence, are most likely to represent a data cluster that represents a situation of interest.


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