The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2011

Filed:

May. 18, 2007
Applicants:

Ming-chun Hsyu, Taichung, TW;

Wen Tsuei, Hsinchu, TW;

Chao-nan Chen, Taichung, TW;

Inventors:

Ming-Chun Hsyu, Taichung, TW;

Wen Tsuei, Hsinchu, TW;

Chao-Nan Chen, Taichung, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H03F 1/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a method and apparatus for determining the new sample points of the location determination system in a wireless environment. In the training phase, after knowing the distribution of the observed radio signal of a location for a target device, the uncertainty of the probability distribution of the received radio signal is analyzed by a location probability distribution model. The radio signal distribution differences are calculated, and the penalties between the location in question and its nearby locations are also calculated, thereby determining whether a location is the candidate of new sample points or the recalibration points. This invention has nothing to do with decision rules and will not undergo the problems of choosing inappropriate decision rules. It also provides a penalty model for generating penalty of error prediction from one location to another location, which can as well easily mitigate the problem on the sample points with the double-role attribute of the border line.


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