The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2011
Filed:
Sep. 28, 2005
Paul A. Larsen, Madison, WI (US);
James B. Rawlings, Madison, WI (US);
Nicola J. Ferrier, Madison, WI (US);
Paul A. Larsen, Madison, WI (US);
James B. Rawlings, Madison, WI (US);
Nicola J. Ferrier, Madison, WI (US);
Wisconsin Alumni Research Foundation, Madison, WI (US);
Abstract
An image of high-aspect-ratio objects is analyzed to locate linear features within the image. The gradient direction for each pixel is determined, and connected pixels having similar gradient directions are grouped into line support regions. A linear feature is determined for each line support region. The linear features are analyzed to identify those that are co-linear. The linear features are then analyzed to find groups that are parallel and that sufficiently overlap. Additional sets of linear features that intersect the identified group are combined into that group. The line support regions of the grouped linear features are analyzed to determine representative orientation and/or dimensional information, which is analyzed to determine statistical information about a plurality of the objects. This information is used to monitor or control one or more processes associated with the objects, to reject the objects or a structure or device comprising the objects, or the like.