The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2011

Filed:

Jan. 17, 2006
Applicants:

Gregor Feldhaus, Munich, DE;

Hagen Eckert, Mering, DE;

Inventors:

Gregor Feldhaus, Munich, DE;

Hagen Eckert, Mering, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 15/00 (2006.01); G01R 13/00 (2006.01); G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An approach is provided for measuring, identifying, and removing at least one sinusoidal interference signal (A·e, A·e) in a noise signal (w(t), w(μ·Δt)). A frequency range to be measured is split into a plurality of frequency bands (ν) via a Fast Fourier Transform (FFT) filter bank. For each of the frequency bands (ν), an autocorrelation matrix ({circumflex over (R)}) is determined, wherein parameters of the autocorrelation matrices ({circumflex over (R)}) are variably adjusted based on whether the at least one sinusoidal interference signal (A·e, A·e) is to be measured, identified, or removed and further based on at least one averaging. The autocorrelation matrices ({circumflex over (R)}) are jointly utilized for one or more of measuring, identifying, or removing the at least one sinusoidal interference signal (A·e, A·e) in the noise signal (w(t), w(μ·Δt)).


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