The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2011

Filed:

Apr. 23, 2008
Applicants:

Yasushi Nagumo, Tokai, JP;

Jun Nukaga, Kasama, JP;

Hiroshi Kamimura, Hitachi, JP;

Noriyuki Sadaoka, Tokai, JP;

Satoshi Takemori, Hitachiohta, JP;

Kojirou Kodaira, Hitachinaka, JP;

Inventors:

Yasushi Nagumo, Tokai, JP;

Jun Nukaga, Kasama, JP;

Hiroshi Kamimura, Hitachi, JP;

Noriyuki Sadaoka, Tokai, JP;

Satoshi Takemori, Hitachiohta, JP;

Kojirou Kodaira, Hitachinaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The pipe inspection method and apparatus can be used to implement rapid, tomographic inspection of a pipe set up at a narrow location. The pipe inspection method includes: a first step for scanning the pipe by translating a radiation source and radiation detector arranged opposedly to the pipe; a second step for the radiation detector to detect radiation that the radiation source has emitted, at given scanning distance intervals; a third step for creating a transmission image of the pipe, based on a radiation dose that the radiation detector has detected; and a fourth step for constructing a tomogram or stereoscopic image of the pipe, based on the transmission image. Thus, it is possible to provide the pipe inspection method and apparatus that can be used to implement rapid, tomographic inspection of the pipe set up at a narrow location.


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