The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2011

Filed:

Oct. 20, 2008
Applicants:

Bruno Kristiaan Bernard DE Man, Clifton Park, NY (US);

Daniel David Harrison, Delanson, NY (US);

Maria Iatrou, Clifton Park, NY (US);

Brian Patrick Smyth, San Francisco, CA (US);

Zhye Yin, Schenectady, NY (US);

Samit Kumar Basu, Fremont, CA (US);

Souma Sengupta, Foster City, CA (US);

Peter Claudius Sanza, Wilmington, NC (US);

Inventors:

Bruno Kristiaan Bernard De Man, Clifton Park, NY (US);

Daniel David Harrison, Delanson, NY (US);

Maria Iatrou, Clifton Park, NY (US);

Brian Patrick Smyth, San Francisco, CA (US);

Zhye Yin, Schenectady, NY (US);

Samit Kumar Basu, Fremont, CA (US);

Souma Sengupta, Foster City, CA (US);

Peter Claudius Sanza, Wilmington, NC (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique is provided for imaging a field of view using an X-ray source comprising two or more emission points. The two or more emission points may be independently operated. Independent operation of the two or more emission points in performed in accordance with a list of commands that specifies the operation of the emission points. The list of commands, in one embodiment, is stored in a sequence buffer. In other embodiments, the list of commands is generated for a given usage, without being stored in a sequence buffer.


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