The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2011

Filed:

Feb. 13, 2009
Applicants:

Xin Liu, Rochester, MN (US);

Lifeng Yu, Rochester, MN (US);

Cynthia H. Mccollough, Byron, MN (US);

Inventors:

Xin Liu, Rochester, MN (US);

Lifeng Yu, Rochester, MN (US);

Cynthia H. McCollough, Byron, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/60 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a material decomposition method capable of determining the distribution of density and constituent material concentration throughout an imaged object. The concentration, in the form of a mass fraction, mass percent, weight fraction, or weight percent, is determined from CT images acquired at different energy levels. The ratio of attenuation coefficients associated with one energy level to attenuation coefficients associated with another energy level is determined and used as an index in a lookup table to determine the concentration of a given material throughout the imaged object.


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