The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2011

Filed:

Dec. 07, 2007
Applicants:

Peter Michael Edic, Albany, NY (US);

Jonathan David Short, Saratoga Springs, NY (US);

John Eric Tkaczyk, Delanson, NY (US);

Xiaoye Wu, Rexford, NY (US);

Inventors:

Peter Michael Edic, Albany, NY (US);

Jonathan David Short, Saratoga Springs, NY (US);

John Eric Tkaczyk, Delanson, NY (US);

Xiaoye Wu, Rexford, NY (US);

Assignee:

Morpho Detection, Inc., Newark, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); H05G 1/60 (2006.01); H05G 1/64 (2006.01); G21K 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An energy-sensitive computed tomography system is provided. The energy-sensitive computed tomography system includes an X-ray source configured to emit an X-ray beam resulting from electrons impinging upon a target material. The energy-sensitive computed tomography system also includes an object positioned within the X-ray beam. The energy-sensitive computed tomography system further includes a detector configured to receive a transmitted beam of the X-rays through the object. The energy-sensitive computed tomography system also includes a filter having an alternating pattern disposed between the X-ray source and the detector, the filter configured to facilitate measuring projection data that can be used to generate low-energy and high-energy spectral information.


Find Patent Forward Citations

Loading…