The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2011
Filed:
Aug. 28, 2008
Jean-baptiste Thibault, Milwaukee, WI (US);
Charles Addison Bouman, West Lafayette, IN (US);
Jeffrey Allen Fessler, Ann Arbor, MI (US);
Ken David Sauer, South Bend, IN (US);
Jean-Baptiste Thibault, Milwaukee, WI (US);
Charles Addison Bouman, West Lafayette, IN (US);
Jeffrey Allen Fessler, Ann Arbor, MI (US);
Ken David Sauer, South Bend, IN (US);
General Electric Company, Schenectady, NY (US);
Perdue Research Foundation, West Lafayette, IN (US);
The University of Notre Dame du Lac, Notre Dame, IN (US);
The Regents of the University of Michigan, Ann Arbor, MI (US);
Abstract
A method and system for image reconstruction of data acquired by a device such as computed tomography is provided. The method and system use a multi-stage statistical iterative reconstruction techniques to provide a three dimensional representation of the scanned object. In one embodiment, the first stage uses a projection-based reconstruction technique, such as Ordered Subset (OS) to converge on a solution for low frequency portion of the image. A subsequent stage uses a voxel-based reconstruction technique, such as Iterative Coordinate Descent (ICD), to converge on a solution for high frequency portions of the image. Systems and methods for reconstructing images from incomplete or partial projection data is also provided.